Measuring the specific surface area of mesoporous silica using x-ray scattering
نویسندگان
چکیده
منابع مشابه
Determination by x-ray reflectivity and small angle x-ray scattering of the porous properties of mesoporous silica thin films
Two-dimensional hexagonal silica thin films templated by a triblock copolymer were investigated by grazing incident small angle x-ray scattering sGISAXSd and x-ray reflectivity sXRd before and after removing the surfactant from the silica matrix. XR curves—analyzed above and below the critical angle of the substrate—are evaluated by the matrix technique to obtain the average electron density of...
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ژورنال
عنوان ژورنال: Acta Crystallographica Section A Foundations and Advances
سال: 2014
ISSN: 2053-2733
DOI: 10.1107/s2053273314094005